By Cody Carroll and Michael Schulte
Objective
The distances between the central maximum and the diffraction minima for a single slit are measured by
scanning the laser pattern with a light sensor and plotting light intensity versus distance. Also, the
distance between interference maxima for two or more slits is measured. These measurements are
compared to theoretical values. Difference and similarities between interference and diffraction patterns
are examined, including the effect of changing the wavelength of the light.
Method
You will be measuring the single slit diffraction and the double slit interference with two different
colored lasers that produce different light waves while moving the background around. You will be
testing to see the differences that light diffraction and interference of different size slits.
Materials
1) Basic Optics Track, 1.2m (1)
2) High Precision Diffraction Slits (1)
3) Red Diode Laser (1)
4) Green Diode Laser (1)
5) Aperture Bracket (1)
6) Linear Translator (1)
7) High Sensitivity Light Sensor (1)
8) Rotary Motion Sensor (1)
,